Showing results: 406 - 420 of 5217 items found.
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CM+ Series -
Gen3 Systems Limited
The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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QTOUCH2204C -
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.
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Cincinnati Test Systems
Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the industry standards for reliability and repeatability. CTS' 30+ years of experience goes way beyond the pressure test unit by offering our customers comprehensive, custom turnkey solutions to the most challenging leak testing problems.
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CITS900s4 -
Polar Instruments Inc
CITS900s4 is the seventh generation of Impedance test system from polar, and typically the most popular model for customers who are new to impedance control. CITS900s4 provides both differential and single ended measurement capability along with 4 channels to provide flexible probe connection.
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BK9013 -
BaKo Co., Ltd
If your company produces millions of D-mics per month, take a look at the BK9013. Based on our BK3012V2 D-Mic Tester, the fully automatic BK9013 is our fastest D-Mic test system. With 4 or 8 couplers, the BK9013 can simultaneously test and sort up to 8 D-Mics into 8 passing grades and 7 different causes of failure in just a few seconds! You can view the results in real time or store them to analyze later.
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TM400 Compact -
Lectrosonics, Inc.
The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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Intepro Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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FOX-XP -
Aehr Test Systems
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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ATS3000A -
Astronics Corporation
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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KRD50 series -
CME Technology Co. Ltd.
KRD50 series transportation simulation test system is to simulate the actual road conditions such as shocks and vibrations during the transportation of various items of a specific load, and to evaluate the effect of the actual working conditions on the loading, unloading, transportation, packaging, sealing or internal structure of the goods. In order to assess or confirm the products and packaging.
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KRD40 series -
CME Technology Co. Ltd.
KRD40 series drop tester, mainly simulates the resistance to drop and impact of large and heavy packaging products. Its strong power system and unique sample holder facilitate easy loading and unloading of oversized and overweight items and automatically rise to the setting. After the height, the drop test is completed. It can realize the drop test of the edge, surface and angle of the sample. This equipment is mainly used to evaluate the ability of product or packaging to withstand drops during transportation and loading and unloading, so as to improve product and packaging design.
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ShibaSoku Co., Ltd.
This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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D&V Electronics LTD
D&V’s diode and rectifier test systems provide a quick, accurate and easy to use interface to check and measure all main parameters of regular and avalanche rectifiers. Real life conditions are simulated to maximize diagnostic capabilities. Additionally, analysis of the rectifier’s thermal resistance can be performed to detect poor internal diode connections and related defects.
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GDLP -
HV Hipot Electric Co.,Ltd.
GDLP series Transmission Line Test System is a new generation power transmission line frequency parameter testing system.It integrated with frequency conversion testing power,precise measuring module and DSP high speed digital processing chip,which eliminate strong interference and ensure the safety of equipment, with convenient, fast and accurate measure .
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FOX-1P -
Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
